Journal of Emerging Trends in Engineering and Applied Sciences: Research Areas

Article Title: Research on the Method of Testability Index Determination for the System-Level BIT Based on Multi-Objective Optimization
by Chunsheng Zhu, Qi Zhang, Hongliang Ran, Fantun Su

Abstract:
By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability. The testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system level BIT testability indexes is established. By using Non-dominated Sorting Genetic Algorithm ? to solve the multi-objective optimization of an example, the validity of the multi-objective optimization model and the feasibility of the solving method are proved

Keywords: multi-object optimization, built-in test, testability index, non-dominated sorting genetic algorithm ?, design for testability

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