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Journal of Emerging Trends in Engineering and Applied Sciences (JETEAS)
ISSN:2141-7016
| Abstract: The compounds of RTIn5 (R: Rare earths, T:Co, Rh), which crystallized in the single crystal form, were studied by nano technology as SEM, EDX and XRD to know some informationa out their crystal structues. The EDX analysis confirmed their stoichiometry yielding R: T: In =1:1:5 (R= rare earths, T=Co,Rh). These compounds crystallize in HoCoGa5 type-structure with the determined lattice constants by XDR. The some party of 13 compounds and remained Indium metal in the surface of RTIn5 were found by the photos of SEM. They were easy to be removed in the surface of samples for other measurements. Moreover, the defect of crystal structure can be estimated as the value of Residual Resistively Ratio (RRR), which was in good agreement with the results of nano technology. |
| Keywords: crystal defect, study of structure, SEM, EDX, XDR. |
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